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Joint Test Action Group
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151	_ V9Technical Notes Add to Reading List Source URL: www.isystem.com Language: English - Date: 2014-09-05 04:49:45 Embedded systems Debugging IEEE standards Microcontrollers Electronics manufacturing Joint Test Action Group Breakpoint Nexus Debugger Computing Computer programming Electronics
152	Howto: Porting the GNU Debugger Practical Experience with the OpenRISC 1000 Architecture Jeremy Bennett Embecosm Add to Reading List Source URL: www.embecosm.com Language: English - Date: 2013-01-16 23:54:44 Debuggers GNU Debugger Joint Test Action Group OpenRISC D GNU Binutils Gdbserver Computer programming Computing Software
153	Danville Signal Processing, Inc. dspblok™ 21469 FLASH CORE PS Add to Reading List Source URL: www.danvillesignal.com Language: English - Date: 2012-12-19 11:27:17 Digital signal processors Microcontrollers Instruction set architectures Microprocessors Electronics manufacturing Joint Test Action Group Blackfin Analog Devices Embedded system Electronic engineering Electronics Computer architecture
154	WiMOD - iM880A Application Note AN010 / Version 0.5 Software development for iM880A Document ID: Category: confidential Add to Reading List Source URL: www.wireless-solutions.de Language: English - Date: 2014-05-22 04:50:54 Computer architecture Microcontrollers Joint Test Action Group STM32 Universal Serial Bus Booting Firmware Atmel AVR Embedded systems Computer hardware Electronics
155	Danville Signal Processing, Inc. dspblok™ 21369+fpga CORE PS FLASH Add to Reading List Source URL: www.danvillesignal.com Language: English - Date: 2010-09-02 08:04:18 Field-programmable gate array Joint Test Action Group Booting Embedded system Nios II Serial Peripheral Interface Bus Altera Universal Serial Bus Atmel AVR Electronic engineering Electronics Computer hardware
156	Haliplex www.xjtag.com E N T E R P R I S E Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2013-06-18 12:24:25 Electronics Boundary scan Joint Test Action Group Embedded system I²C Scan chain Electronics manufacturing Manufacturing Electronic engineering
157	Datasheet High Quality, Low Cost Test Overview DFTMAX™ is a comprehensive Add to Reading List Source URL: www.synopsys.com Language: English - Date: 2015-03-20 14:15:36 Electronics manufacturing Electronic design Integrated circuits Automatic test pattern generation Test compression Scan chain Boundary scan Joint Test Action Group Physical design Electronic engineering Electronics Electronic design automation
158	_ V1.5 Hardware Reference Add to Reading List Source URL: www.isystem.com Language: English - Date: 2008-12-04 07:49:46 Embedded systems PC Card PCMCIA Joint Test Action Group D-subminiature Computer hardware Motherboard Standards organizations
159	C8051F12x-DK C8051F12 X D E V E L O P M E N T K I T U S E R ’ S G U I D E 1. Kit Contents The C8051F12x Development Kit contains the following items: • C8051F120 Target Board • C8051Fxxx Development Kit Quick-Start Add to Reading List Source URL: gdansk.bradley.edu Language: English - Date: 2015-02-19 03:04:56 Electronics manufacturing Joint Test Action Group Microcontrollers Electrical connectors Universal Serial Bus Programmer RS-232 Pinout Atmel AVR Computer hardware Electronics Electronic engineering
160	VTOS Program™ Everything you need to program all programmable devices on your circuit board VTOS Program is a low-cost software product that provides everything you need to program all of the programmable devices on yo Add to Reading List Source URL: www.etoolsmiths.com Language: English - Date: 2015-01-25 12:00:01 Computer hardware Embedded systems Joint Test Action Group Booting Field-programmable gate array Secure Digital USB flash drive Electronics Electronic engineering Electronics manufacturing

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